Aantal
Winkelwagen is leeg
0
Componenten
Toggle
Component zoeken
Bedrijfsprofiel
Over ons
Bedrijfsgegevens
Contact
Componenten
Componenten
Component zoeken
Bedrijfsprofiel
Over ons
Bedrijfsgegevens
Contact
select
Producten
Mahr Autumn Sale 2024!
Close
Afbeelding 1 van 1
Maximize image
Restore image
Item 1 of 1
SALE
MarSurf CD 140 AG with roughness option
Contour measuring station
MarSurf CD 140 AG 11
Manual contour measuring station without PC comprising:
- MarSurf CD 140 AG 11 including
350 mm Z-axis with manual quick and fine adjustment,
140 mm X-axis,
machine base including 60 mm Y-adjustment and 50 mm hole grid,
Lees meer
€ 26.045,00
€ 19.990,00
(€ 24.187,90 incl. BTW)
Bestelcode
6269202
↑ Verplicht
Spin Up
Spin Down
Plaats in winkelwagen
Contour measuring station
MarSurf CD 140 AG 11
Manual contour measuring station without PC comprising:
- MarSurf CD 140 AG 11 including
350 mm Z-axis with manual quick and fine adjustment,
140 mm X-axis,
machine base including 60 mm Y-adjustment and 50 mm hole grid,
stylus element PG A 36-350-25 (contour) with magnetic stylus tip holder
stylus element PG A 20-350-5/90° (roughness) with magnetic stylus tip holder
- MarWin EasyContour plus mobile software and "Roughness in Contour View" option
- Contour calibration master with two spheres (45 mm and 6 mm) including Mahr calibration certificate
Fast measuring and retooling
• Short measuring times thanks to high positioning and measuring speeds
• Manual quick adjustment of the drive unit in the Z-axis with fine adjustment for optimum alignment
• Quick, tool-free change of the probe arm thanks to magnetic suspension – without recalibration
• Tracing force selection prevents incorrect measurements
Flexible and versatile in use
• Workpiece mounting plate offers sufficient space even for large workpieces
• Large measuring range of 70 mm for versatile applications
• Maximum handling flexibility thanks to mounting plate with 50 mm bore size
• Wide selection of probe arms and accessories
Extensive software package
• Measurement of double contours, e.g. for determining diameters
• Optional roughness measurement from Rz 2 μm possible
• Simple and intuitive contour measurement and evaluation
• Start Quick & Easy programs by reading in DMC codes
TECHNICAL DATA
Resolution 19 nm
Dimensions in mm 572 x 905 x 822 mm
Measuring speed 0.1 mm/s to 10 mm/s
Positioning speed X: 0.1 mm/s to 200 mm/s
Probe Contour probe system
Measuring range mm 70 mm with probe arm length 350 mm
Measuring force (N) 4 mN to 30 mN, adjustable using software